The Mel-Build policy.
We are developing for user efficiency of Transmission Electron Microscopes.
We are developing user friendly gadgets for all Transmission Electron Microscope users.
We are developing for science advancement.
We are to meliorate building of technology for users all over the world.



The story of Mel-Build since 2005.
First we realized the strong technological needs for further development of 3D Tomography.
Our first challenge was to make it possible to move a TEM sample for crystalline nanostructures.
The project was to develop a completely new specimen holder for 3D tomography purposes.
This project started in the summer of 2005, it was involving several engineers and high level TEM users.
The project itself succeeded, and as another result the company Mel-Build was founded.
New ideas and technology are co-developed by Mel-Build and Kyushu university.


Announcement.

 Our team's article 「電子線トモグラフィーによる格子欠陥の3次元可視化」 
            It was recognized "The 1st Materia Prize"  by The Japan Institute of Metals. at 8 November 2011
                          http://ci.nii.ac.jp/naid/10026403106

 Our team's HATA Holder is awarded a Best Prize of contrivance branch at poster session
                       by JSM-2010 The 66th Annual Meeting of the Japanese Society of Microscopy.

   Poster number: P-I43
   Title: ( High Angle Triple Axis - Holder and applications )  高傾斜3軸試料ホルダーとその応用
           ( ○S.Hata,1, H.Miyazaki,2, M.Mitsuhara,1, K.Ogata,1,  K.Ikeda,1, H. Nakashima,1 )  
                    1    Department of Molecular and Materials, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University
                    2    Our Mel-Build
                         Jump to our Gallery of the prize winner for photograph and poster competition.

Trivia !
                         Jump to nice Tweezes list for TEM user ( Only Japanese)

                          Jump to Intoroduce for Unstable indication of Beam of Screen Current
 
                   
Mel-Build HATA Holder が ニュースにちょっとだけ出演しました。

               




    Go to relative events Lists
                       Conference

                       Symposium
                       Workshop
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   Recommended a book for 3D/4D imaging
            (Only Japanese.)
  3D/4D観察 (Tomography法)に欠かせない
          「画像処理とは?」
       「最新の再構成手法とは?」
  等を知るのに最適な書籍を御紹介致します。
  

       


         


Link to HATA-Holder applied articles.

New! High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy
    S. Hataa, H. Miyazakib, S. Miyazakic, M. Mitsuharaa, M. Tanakad, K. Kanekod, K. Higashidad, K. Ikedaa, H. Nakashimaa, S. Matsumurae, J.S. Barnardf, J.H. Sharpf and P.A. Midgleyf
     a Department of Electrical and Materials Science, Kyushu University, Kasuga, 6-1 Kasugakoen, Kasuga, Fukuoka 816-8580, Japan
     b Mel-Build, Nishi-ku, Fukuoka 819-0052, Japan
     c FEI Company Japan Ltd., Minato-ku, Tokyo 108-0075, Japan
     d Department of Materials Science and Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan
     e Department of Applied Physics and Nuclear Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan
     f Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK

   Abstract
    Electron tomography requires a wide angular range of specimen-tilt for a reliable three-dimensional (3D) reconstruction.
    Although specimen holders are commercially available for tomography, they have several limitations, including tilting capability in only one or two axes at most, e.g. tilt–rotate.
    For amorphous specimens, the image contrast depends on mass and thickness only and the single-tilt holder is adequate for most tomographic image acquisitions.
    On the other hand, for crystalline materials where image contrast is strongly dependent on diffraction conditions, current commercially available tomography holders are inadequate,
    because they lack tilt capability in all three orthogonal axes needed to maintain a constant diffraction condition over the whole tilt range.
    We have developed a high-angle triple-axis (HATA) tomography specimen holder capable of high-angle tilting for the primary horizontal axis with tilting capability in the other
     (orthogonal) horizontal and vertical axes.
    This allows the user to trim the specimen tilt to obtain the desired diffraction condition over the whole tilt range of the tomography series.
    To demonstrate its capabilities, we have used this triple-axis tomography holder with a dual-axis tilt series (the specimen was rotated by 90° ex-situ between series)
     to obtain tomographic reconstructions of dislocation arrangements in plastically deformed austenitic steel foils.

   Highlights
     A double tilt–rotate specimen holder for diffraction contrast imaging in electron tomography.
     Precise alignment of a diffraction condition for tilt-series acquisition of TEM/STEM images.
     Complete visualization of 3D dislocation arrangements by dual-axis STEM tomography.

   Keywords:
    Electron tomography; Specimen holder; Diffraction contrast; Dislocation; Scanning transmission electron microscopy (STEM)

   Article Outline
    1. Introduction
    2. Concept and design of high-angle triple-axis specimen holder
       2.1. High-angle double-tilt mechanism
       2.2. Rotational and exchangeable specimen stage
    3. Application of the high-angle triple-axis specimen holder
       3.1. Experimental settings for dual-axis dislocation tomography
       3.2. Tilt-series acquisition and tomographic 3D reconstruction
    4. Discussion
       4.1. Strengths and weaknesses of the high-angle triple-axis specimen holder
       4.2. Limitations and experimental settings of dislocation tomography
    5. Conclusions

  Publication: Ultramicroscopy   Publisher:  Elsevier (Copyright © 2011, Elsevier )
   Article  Ultramicroscopy, Volume 111, Issue 8, July 2011, Pages 1168-1175
       Received 1 October 2010; revised 25 March 2011; accepted 29 March 2011. Available online 9 April 2011

            You are able to get the full-text article at ScienceDirect. ( DOI: 10.1016/j.ultramic.2011.03.021)
                           http://dx.doi.org/10.1016/j.ultramic.2011.03.021


New! DISLOCATION ELECTRON TOMOGRAPHY OF BOUNDARIES IN DEFORMED ALUMINIUM
    Amuthan Ramar*, Satoshi Hata**, Xiaoxu Huang***, Rafal E. Dunin Borkowski* and Grethe Winther***
     * Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
     ** Department of Engineering Sciences for Electronics and Materials, Kyushu University, Kasuga, Fukuoka 816-8580, Japan
     *** Danish-Chinese Center for Nanometals, Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark, DK-4000 Roskilde

   Abstract
    Dislocation tomography has been applied to deformation-induced dislocation boundaries in tensile deformed aluminium.
    Using one diffraction vector a series of Scanning transmission electron microscopy (STEM) high-angle annular dark field (HAADF) images at a wide range of tilt angles
    has been acquired and reconstructed in three dimensions (3D).
    The data reveal the detailed dislocation arrangement wihtin a planar boundary and also the 3D shape of curved cell boundaries.
                           http://www.rafaldb.com/papers/C-2010-09-Riso-Symposium-dislocation-tomography-of-deformed-Al.pdf


New! 3D structures of alloys and nanoparticles observed by electron tomography
    Kazuhisa Sato, Kenta Aoyagi and Toyohiko J. Konno
            Laboratory for Advanced Analysis of Materials, Tohoku University.

   Abstract
    3D structures of bulk alloys and nanoparticles have been studied by means of electron tomography using scanning transmission electron microscopy (STEM).
    In the case of nanoparticles of Fe-Pd alloy, particle size, shape, and locations were reconstructed by weighted backprojection (WBP),
    as well as by simultaneous iterative reconstruction technique (SIRT).
    We have also estimated the particle size by simple extrapolation of tilt-series original data sets, which proved to be quite powerful.
    We demonstrate that WBP yields a better estimation of the particle size in the z direction than SIRT does,
    while the latter algorithm is superior to the former from the viewpoints of surface roughness and dot-like artifacts.
    In contrast, SIRT gives a better result than WBP for the reconstruction of plate-like precipitates in Mg-Dy-Nd alloys, in respect of the plate thickness perpendicular to the z direction.
    We also show our recent results on the 3D-tomographic observations of microstructures in Ti-V-Al, Ti-Nb, Cu-Ag, and Co-Ni-Cr-Mo alloys obtained by STEM tomography.

   Article
            Optical Measurements, Modeling, and Metrology, Volume 5
            Conference Proceedings of the Society for Experimental Mechanics Series, Volume 1/2011- Volume 9999999, Optical Measurements, Modeling, and Metrology, Volume 5, Pages 1-9

            You are able to get the full-text article at SpringerLlink ( DOI:  10.1007/978-1-4614-0228-2_1 )
                           http://www.springerlink.com/content/h2567r721186w36p/


New! Three-dimensional shapes and distribution of FePd nanoparticles observed
            by electron tomography using high-angle annular dark-field scanning transmission electron microscopy

    Kazuhisa Sato, Kenta Aoyagi and Toyohiko J. Konno
            Laboratory for Advanced Analysis of Materials, Tohoku University.

   Introduction
    Recent developments in ultrahigh density magnetic storage technology rely on novel recording media with a high magnetocrystalline anisotropy energy (MAE),
    in order to increase storage density and to reduce recording noises.
    FePd alloy nanoparticles with the L10-type ordered structure is one of the candidate materials suitable for the ultrahigh density magnetic storage media.
    The hard magnetic properties of these alloy nanoparticles originate from the tetragonal ordered structure,
     which gives rise to a high MAE,1,2 and thus the atomic ordering is a key issue for improving the hard magnetic properties of the L10-type alloy nanoparticles.
    Therefore previous studies have focused on the atomic structure inside the nanoparticles.3,4,5 On the other hand, high-areal density packing of nanoparticles
     and control of magnetostatic interaction among nanoparticles are considered as the next step to realize ultrahigh density magnetic storage media.
    For this purpose, it is desired to visualize and understand three-dimensional (3D) shapes of nanoparticles and spatial configuration of neighboring particles precisely.
    One of the interests here is the height (thickness) and the aspect ratio (height/diameter) of particles from view points of the shape anisotropy of very small nanoparticles.
    However, in transmission electron microscopy (TEM), an accurate evaluation of the sample height is usually difficult and subject to careful examinations.

    Electron tomography, especially its applications to materials science, is a novel technique,
     which can retrieve 3D structural information usually missing in TEM and scanning TEM (STEM).
    A 3D structure can be reconstructed by processing a tilt series of electron micrographs with mass-thickness contrasts, formed by several different imaging techniques:
    bright-field (BF) TEM,6,7,8 dark field TEM ,9,10,11 atomic number (Z) contrast of STEM,12,13,14 energy-filtered TEM, 13 and electron holography.
    15 The recent progress in this field has been summarized in review articles.
    16,17 In all the techniques, acquisition of clear contrast images and accurate alignments of the sample position and/or the tilt axis are essential for subsequent 3D reconstruction.
    Some model simulations on the accuracy of reconstruction have been presented in detail.13 Quantitative analyses have revealed the complex 3D structures of nanoporous gold.
    18,19 Recent reports have shown, for example, facetted surfaces in reconstructed Pt nanoparticles20 or Pd nanoparticles.
    21 Alloyeau et al. 22 have carried out a quantitative thickness analysis of CoPt nanoparticles by comparing a focal series of high-resolution TEM (HRTEM) images
    with the reconstructed 3D structures of BF-TEM tilt series.
    As demonstrated by them, an investigation for a novel method to quantify 3D reconstructed structures is one of the fundamental interests in the electron tomography.

    In this study we have examined 3D shapes and distributions of L10-FePd  alloy nanoparticles epitaxially grown on the single crystal NaCl(001) substrate
    by means of electron tomography using Z-contrast of high-angle annular dark-field (HAADF) STEM.
    The Z-contrast can be regarded as a suitable mass-thickness contrast required for electron tomography,
    where incoherent imaging is dominant with negligible contribution of diffraction contrasts.
    We compare, in a semiquantitative manner, the accuracy of thickness of the nanoparticles deduced
    by different reconstruction techniques using a tilt-series data set of HAADF-STEM images of the FePd nanoparticles.

   Article
            Journal of Applied Physics / Volume 107 / Issue 2 / ARTICLES / Nanoscale Science and Design / Back to Abstract
            Conference Proceedings of the Society for Experimental Mechanics Series, Volume 1/2011- Volume 9999999, Optical Measurements, Modeling, and Metrology, Volume 5, Pages 1-9

            You are able to get the full-text article at AIP Journal of Applid Physics( DOI:  10.1063/1.3280026 )
                          http://jap.aip.org/resource/1/japiau/v107/i2/p024304_s1?bypassSSO=1


Characterization of Crack-Tip Dislocations and their Effects on Materials Fracture
    Kenji Higashida, Masaki Tanaka, Sunao Sadamatsu
    Department of Materials Science and Engineering, Kyushu University

   Keywords:
    Crack, Dislocation, Shielding, Dislocations, Tomography,

   Abstract
    Three-dimensional structure of crack tip dislocations were investigated by combining scanning transmission electron microscopy (STEM)
     and electron tomography (ET) in silicon single crystals.
    P-type (001) silicon single crystals were employed.
    <110> cracks were introduced from an indent on the (001) surface.
    The specimen was heated at 873K in order to introduce dislocations at the crack tips.
    The specimen was thinned to include the crack tip in the foil by an iron milling machine.
    STEM-ET observation revealed the three-dimensional structure of crack tip dislocations.
    Their Burgers vectors were determined by using an invisibility criterion.
    The local stress intensity factor was calculated using the dislocation characters obtained in the observation in this study,
    indicating that the islocations observed were mode II shielding type dislocations.

   Article
            Journal Materials Science Forum (Volumes 654 - 656)
            Volume PRICM7
            Edited by Jian-Feng Nie and Allan Morton Pages 2307-2311

            You are able to get the full-text article at Scientific.Net. ( DOI:  10.4028/www.scientific.net/MSF.654-656.2307 )
                           http://www.scientific.net/MSF.654-656.2307


3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography
    Masaki Tanaka*, Masaki Honda, Sunao Sadamatsu and Kenji Higashida
    Department of Materials Science and Engineering, Kyushu University, Motooka Fukuoka, 812-8581 Japan

   Abstract
            Three-dimensional structures of crack-tip dislocations in silicon crystals have been examined
           by combining scanning transmission electron microscopy and computed tomography.
            Cracks were introduced by a Vickers hardness tester at room temperature,
            and the sample was heated at 823 K for 1 h in order to introduce dislocations around the crack tips.
            Dislocation segments cut out from loops were observed around the crack tip. the three-dimensional structure of which was characterized by using by electron tomography.
            Their Burgers vectors including the sings were also determined by oscillating contrasts along dislocations.
            In order to investigate the effect of the dislocations on fracture behaviours, local stress intensity factor due to one dislocation was calculated,
            which indicates the dislocations observed were shielding type to increase fracture toughness.

   Keywords
            electron tomography, scanning transmission electron microscopy

   Article
            Journal of Electron Microscopy
            Received October 19, 2009.    Revision received March 9, 2010.     Accepted March 9, 2010.     First published online: June 15, 2010

            You are able to get the full-text article at Journal of Electron Microscopy.( DOI:  doi: 10.1093/jmicro/dfq031 )
                           http://jmicro.oxfordjournals.org/content/early/2010/06/15/jmicro.dfq031.abstract


Crack tip dislocations revealed by electron tomography in silicon single crystal
    Masaki Tanakaa,a, Kenji Higashida,a, Kenji Kanekoa, b, Satoshi Hata,c, Masatoshi Mitsuhara
,c
    a Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
    b JST-CREST, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
    c Department of Engineering Sciences for Electronics and Materials, Kyushu University, 6-1 Kasuga koen, Kasuga, Fukuoka 816-8580, Japan

   Abstract
            Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography.
            A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations.
            The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.

   Keywords
            Electron tomography; Fracture; Dislocations; Transmission electron microscopy; Scanning transmission electron microscopy

   Article
            Scripta Materialia
            Volume 59, Issue 8, October 2008, Pages 901-904
            Received 10 June 2008; revised 25 June 2008; Accepted 25 June 2008. Available online 6 July 2008.

            You are able to get the full-text article at ScienceDirect.
                           http://www.sciencedirect.com/science/article/pii/S1359646208005046


Fabrication and characterization of TiN nanocomposite powders fabricated by DC arc-plasma method
    K. Kaneko a, b, K. Kitawaki a, S. Sadayama c, H. Razavi a, J.C. Hernandez-Garrido d, P.A. Midgley d, H. Okuyama e, M. Uda e and Y. Sakka e, f
    a Department of Materials Science and Engineering, Graduate School of Engineering, Kyushu University, Fukuoka, Japan
    b JST-CREST, Japan
    c FEI Company Japan Ltd., Tokyo, Japan
    d Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
    e Nano Ceramics Center, National Institute for Materials Science, Tsukuba, Ibaraki, Japan
    f WPI Center for MANA, National Institute for Materials Science, , Tsukuba, Ibaraki, Japan

   Abstract
            TiN nanocomposite powders with various morphologies were synthesized by DC arc-plasma method from Ti-Si ingot under N2-H2-Ar atmosphere.
            Microstructures of powders were characterized by powder X-ray diffraction method and transmission electron microscopy with compositional analysis,
            then morphologies by three-dimensional electron tomography.
            It was found that the powders were consisted of TiN nanoparticles covered by Ti5Si3 nanoparticles,
            which possibly suppressed the growth of facets and controlled the final morphologies of TiN-Ti5Si3 nanocomposite.

   Keywords
             XRD; TEM; Electron tomography; TiN; Nanocomposite

   Article
            Journal of Alloys and Compounds Volume 492, Issues 1-2, No.147 Pages 685-6904 March 2010
            Received 24 September 2009; revised 29 November 2009; accepted 3 December 2009. Available online 9 December 2009.

            You are able to get the full-text article at ScienceDirect.
                           http://linkinghub.elsevier.com/retrieve/pii/S0925838809025705


Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
    K. Kaneko a, b, K. Kitawaki a, S. Sadayama c, H. Razavi a, J.C. Hernandez-Garrido d, P.A. Midgley d, H. Okuyama e, M. Uda e and Y. Sakka e, f
    a Department of Materials Science and Engineering, Graduate School of Engineering, Kyushu University, Fukuoka, Japan

    Masaki Tanaka1, Masaki Honda1;*, Masatoshi Mitsuhara2, Satoshi Hata2, Kenji Kaneko1;3 and Kenji Higashida1
    1Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395, Japan
    2Department of Engineering Sciences for Electronics and Materials, Kyushu University, Kasuga 816-8580, Japan
    3JST-CREST, Fukuoka 819-0395, Japan

   Abstract
            Dislocations in a silicon single crystal introduced by three point-bending at a high temperature were observed by electron tomography
            in annular dark field-scanning transmission electron microscopy (ADF-STEM).
            Commercially available P type (001) single crystal wafers were employed.
            An ADF STEM tilt series was acquired from 60 to þ60 in tilt range with 2 in tilt step.
            The diffraction vector was maintained close to g(hklÞ) 220 during the acquisition by adjusting the [110] direction of the sample parallel to the tilt axis of the holder.
            The observed dislocations were reconstructed by simultaneous interactive reconstruction technique,
            exhibiting a 3-D configuration of dislocations introduced by the three-point bending.

   Keywords
             mechanical property, scanning transmission electron microscopy (STEM), annular dark field (ADF)

   Article
            Materials Transactions, Vol. 49, No. 9 (2008) pp. 1953 to 1956 2008 The Japan Institute of Metals
            [doi:10.2320/matertrans.MAW200828]

            You are able to get the full-text article at Material Transactions Online the Japan Institute of Metals(JEM).
                          http://www.jim.or.jp/journal/e/49/09/1953.html




Japanese applied articles.

Three dimensional tomographic technique applied to martensitic transformations in Ti alloys (Only Japanese.)
            T.J. Konno T.Kiguchi, K.Sato
            Laboratory for Advanced Analysis of Materials, Tohoku University.
             IMR (KINKEN) Institute for Materials Research, Tohoku University, Aoba-ku, Sendai 980-8577, Japan
            三次元トモグラフィー法を活用した形状記憶チタン合金のマルテンサイト変態の解明
                          http://www.imr.tohoku.ac.jp/jpn/library/houkoku/2010b/pdfsj20/0102konno.pdf
            回復・再結晶化過程における転位分布の高精度三次元可視化技術の開発
                           http://www.jfe-21st-cf.or.jp/jpn/hokoku_pdf_2009/17.pdf


About acquisition method of the 3D Tomography of crystalline nanostructures using TEM. (Only Japanese.)
   電子線トモグラフィー技術情報記事のご紹介 
    文献名:   透過型電子顕微鏡を利用した結晶性材料の3次元ナノ形態解析
    著者:     九州大学大学院工学研究院材料工学部門 准教授  金子 賢治 先生
    刊行物名:   センターニュース  分析機器解説シリーズ102   Vol.27 No.4,2008
    発行者:   九州大学中央分析センター
                           http://www.bunseki.cstm.kyushu-u.ac.jp/F/102.pdf


回復・再結晶化過程における転位分布の高精度三次元可視化技術の開発  (Only Japanese.)
    東北大学金属材料研究所  教授 今野 豊彦 先生,准教授 木口 賢紀 先生,助教 佐藤 和久 先生
                          http://www.jfe-21st-cf.or.jp/jpn/hokoku_pdf_2009/17.pdf


Development of the High Angle Triple Axis tomography specimen holder.  (Only Japanese.)
                           http://www.saga-ls.jp/images/file/books_publication/seikahoukokukai_houkokusho/H20nendo/04.pdf



Link to exchange partners.


Kyushu Synchrotron Light Research Center.
                           http://www.saga-ls.jp/

Workshop of Kyushu electron microscope technology  (Only Japanese.)
                          http://www.med.kyushu-u.ac.jp/nano/


If you are a member of our Team Kyushu, please click log-in below (password protected).




Microscopy relative events list. (顕微鏡関連学会一覧)

2016

 第72回学術講演会
    テーマ:垣根を越えた顕微鏡時代に向けて
 日時: 2016年6月14日(火)~16日(木)
    場所: 仙台国際センター
  

          



Dear all.

             Please contact and tell us by all means, if you know other important symposium, conference and seminar that are related to electron microscopy.
             If your information is agrees to the main point of this academical seminar and conferencelist, we add it to this listing of this site.
             let's expand the electron microscopy wonderful world to everybody.

             Best regards

             H Miyazaki              info@melbuild.com
             Mel-Build Research Institute




History of Emotional events before 2012. )
                        Please Click here to jump to List



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Mel-Buildの夢

電子顕微鏡を用いていらっしゃる世界の研究者の方々へ、
Mel-Buildの技術が少しでも役立つことで、世界の科学技術の発展に貢献出来ることを夢としています。。
特に、電子線トモグラフィー 3次元ナノ構造解析 ナノスケールの3次元解析 3次元形態・分布解析をサポートすることで、
多様な電顕顕微鏡を用いた下記研究に支援できることを自負します。

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透過型電子顕微鏡法 析電子顕微鏡法 透過型電子顕微鏡暗視野法 高分解能電子顕微鏡法 収差補正透過電子顕微鏡法
エネルギーフィルター EELS PEELS 特定X線分析法 EDS EDAX
鏡走査透過電子顕微鏡法 STEM HAADF‐STEM モンテカルロシミュレーション ナノインデント法
組成傾斜法 FIB マイクロサンプリング法 電子チャネリングX線分光法 ALCHEMI 動力学的回折理論 など


オブジェクト
超格子 超分子 結晶化 微細組織 粒界 ひずみ 格子欠陥 先進耐熱鋼 超塑性 スピネル型酸化物結晶
析出物 結晶材 成長過程 料結晶配向化の相関 長周期規則化ナノ組織形成過程の解明及び制御
相変態過程 相変態 長周期構造 逆位相境界 Cu添加による鋼の強化機構 基板表面構造 積層膜 磁性薄膜 方位制御 など


テーマとする材料
次世代デバイス SrTiO3/Nb-SrTiO3 シリコン系半導体結晶 シリコン Si-Ge 非晶質SiGe薄膜 InGaAsP
GOI Ge薄膜 SiO2 COE アパタイト
セラミックス Al2O3 ZrO2 SrTiO3 ZnO, TiO2 
フェライト鋼 マルテンサイト 鉄シリサイド クロム系鉄鋼  
金属系超伝導体Nb3Sn MgB2 超伝導材料 超伝導 磁性薄膜 超伝導薄膜 Y系超電導線材 β-FeSi2薄膜(結晶薄膜)高輝度発光 
NdFeB Nd-Fe-B ネオジムー鉄-ボロン 焼結磁石(Tb改質)ネオジム磁石 電磁波吸収材 Znフェライト被覆 軟磁性複合材 
Al-Li Al3Z Al-Mg-Li-Zr Mg-Al-Zr 軽金属系合金
TiAl系構造材料 Ti-Al系耐熱材料 Ti-Al-Mo合金 Ni-Mo系合金 Ti-Nb-Ta-Zr系合金
薄膜 線材 Fe-Cu ダイヤモンド薄膜 フラーレン Cs3C60 カーボンナノチューブ
LiBH4 など



プロセス
急冷凝固法 金属誘起結晶化法 低温結晶化法 エピタキシャル成長法 水素処理法 MOCVD法 PLD法 スパッタ法 ECAP法
ボールミリング処理法 プラズマ回転電極法 プラズマイオン注入法PREP プラズマレーザー堆積法 AIC法 イオンビーム合成法 
FIB Focused Ion Beam法 STSP法 Severe Torsion Straining Process エックス線照射法 急冷遠心鋳造プロセス法
CVD法 エッチング法 など


効果
機能材料の開発 新材料創製 機能イノベーション被覆処理 収着処理 水素吸蔵合金材料の開発 光電変換
有機半導体 ポストシリコンデバイス など



水素エネルギーシステム 高密度水素貯蔵材料
量子コンピューター 超高感度磁気センサー 揮発性磁気記憶素子 MRAM 金属ガラス
高性能燃料電池 高性能太陽電池 スピン電池 高性能リチウムイオン電池 透明エレクトロニクス 生体用合金 など

絶対目標
地球環境保全