TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
 TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

X(Alfa)axis: }80 deg. Y(Beta): }7.5 deg.@Rotation: }5 deg.
High efficiency EDS analysis TEM Holder
Easy to link with other instruments by using cartridge



TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

Double Tilt + High Tilt + Cartridge
Multi Function Special Mechanism


TEM holder ŽŽ—Ώƒzƒ‹ƒ_[ TEM SEM EDX tensile ˆψ’£‚θ@Tomography@3D
TEM holder ŽŽ—Ώƒzƒ‹ƒ_[ TEM SEM EDX tensile ˆψ’£‚θ@Tomography@3D
TEM holder ŽŽ—Ώƒzƒ‹ƒ_[ TEM SEM EDX tensile ˆψ’£‚θ@Tomography@3D

 Schematic diagrams of tilted specimen stages of side-entry holders in objective-lens pole pieces, viewed along the primary tilt axis X (ƒΏ) parallel to longitudinal directions of the holders.

 (a) The case of a standard double-tilt holder with aCradle (specimen stage) attached to the holder by @ @@@@@pivot pins at the secondary tilt axis Y

(ƒΐ) (b) The case of a tomography holder without the supporting outer frame at Y (ƒΐ) tilt axis.

TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
For Example APT Attachment Link Solution
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
In tomography of crystal materials, it is important to align crystal orientation in precise 0.1 deg at taking tilt series. Here, it is not only needed to align tilf of Y(beta) axis, but also needed to align azimuth rotation in precise. Index Dock System (IDS) is a rotator which can be rotation in precise in 0.01‹.Rotation angle is checked by micrometer and digital display.This holder supports taking a good quality tilt series.  

 TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
 TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
3. 2009~, EMAT, University of Antwerp STEM dislocation tomography
for nano-grained metals and FIB induced defects
H. Idrissi, M. Mitsuhara, S. Hata, D. Schryvers et al. Microsc. Microanal. (2011) 


TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

3D reconstruction of a single Al nanograin viewed along the thickness of the film,
revealing multiple dislocation loops especially near to the top surface
(indications of top & bottom surfaces relate to the FIB sample surfaces).
Three orthoslices selected at depth positions A, B and C in the grain shown in the left figure.
Only the top slice C shows long dislocation lines pinned near the surface of the film
by point defect clusters created during FIB milling.

TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis