|3. 2009~, EMAT, University of Antwerp STEM dislocation tomography
for nano-grained metals and FIB induced defects
H. Idrissi, M. Mitsuhara, S. Hata, D. Schryvers et al. Microsc. Microanal.
3D reconstruction of a single Al nanograin viewed along the thickness of
revealing multiple dislocation loops especially near to the top surface
(indications of top & bottom surfaces relate to the FIB sample surfaces).
Three orthoslices selected at depth positions A, B and C in the grain shown
in the left figure.
Only the top slice C shows long dislocation lines pinned near the surface
of the film
by point defect clusters created during FIB milling.