Until now it was not possible to use BF/DF in combination with Ultrascan
Oruus for Tecnai and Titan Low base type, TEM's.
Please see the data collected below and the different information provided
from BF - DF - HAADF, all in one scan!
STEM Image of crystal orientated Silicon This preview shows image collected in one scan using 3 detectors simultaneously. Note the unique information from each detector. (HAADF and DF collects different
diffraction information) ( Note:
Below images are collected with TIA, a software provided by FEI Company )
Product design or product specification are subject
to change without prior notice.
Gatan and Ultrascan, Orius are either registered
trademarks of Gatan Company
FEI, FEI Company, FEI (stylized logo) and Tecnai,
Titan are either registered trademarks or trademarks of FEI Company.