TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS AnalysisTEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
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 TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
 

Easy Link to manufacturer's SEM and FIB TEM Holder.
By the rotation function on the holder shaft part,
the back side can be observed, and can use Hitachi FIB.


TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

Easy Link to between Hitachi TEM and FEI FIB Image

TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

 Just by rotating the knob in the photo, you can easily change the mode,
You can observe the surface and observe the back side
without replacing the sample,and can also be inserted into FIB made by Hitachi.
Also, sample setup mode for safe replacement of sample cartridgeI have it.
By fitting it to the red line, it makes it possible to attach it to Safety Operation Stand.




Double Tilt Catridge Solution

TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
For Example APT Attachiment Link Solution
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis
3. 2009~, EMAT, University of Antwerp STEM dislocation tomography
for nano-grained metals and FIB induced defects
H. Idrissi, M. Mitsuhara, S. Hata, D. Schryvers et al. Microsc. Microanal. (2011) 


TEM Holder tem Holder Sample Holder Specimen Holder Tensile Holder Cryo Holder Cooling Holder Vacuum Transfer Holder HATA SATO ATMOS SEM TEM SEM Stage Vacuum Station Tomography EDS Analysis

3D reconstruction of a single Al nanograin viewed along the thickness of the film,
revealing multiple dislocation loops especially near to the top surface
(indications of top & bottom surfaces relate to the FIB sample surfaces).
Three orthoslices selected at depth positions A, B and C in the grain shown in the left figure.
Only the top slice C shows long dislocation lines pinned near the surface of the film
by point defect clusters created during FIB milling.