Easy Link to manufacturer's SEM and FIB TEM Holder.
By the rotation function on the holder shaft part,
the back side can be observed, and can use Hitachi FIB.
Easy Link to between Hitachi TEM and FEI FIB Image
| Just by rotating the knob in the photo, you can easily change the mode,
You can observe the surface and observe the back side
without replacing the sample,and can also be inserted into FIB made by
Also, sample setup mode for safe replacement of sample cartridgeI have
By fitting it to the red line, it makes it possible to attach it to Safety
Double Tilt Catridge Solution
For Example APT Attachiment Link Solution
|3. 2009~, EMAT, University of Antwerp STEM dislocation tomography
for nano-grained metals and FIB induced defects
H. Idrissi, M. Mitsuhara, S. Hata, D. Schryvers et al. Microsc. Microanal.
3D reconstruction of a single Al nanograin viewed along the thickness of
revealing multiple dislocation loops especially near to the top surface
(indications of top & bottom surfaces relate to the FIB sample surfaces).
Three orthoslices selected at depth positions A, B and C in the grain shown
in the left figure.
Only the top slice C shows long dislocation lines pinned near the surface
of the film
by point defect clusters created during FIB milling.