In-situ Nano Order Tensile TEM Holder
Nano-Order Tensile:min.step 1nm
Prepare 2 type holder of Polymer and material model
Cartridge structure:Easy link to Microtome and FIB
Polymer and materila Nano order Tensile data Collection
Cu-6Sn HR 5nm Tensile
Prof. M. Murayama (Virginia Tech)
Microscopy, 67, 296-300 (2018).
Prof. Jinnai Tohoku University
As shown in the video above, it is possible to perform a tensile test by dynamic observation.
Cartridge Structure
Material Model
Co-developer Prof.Kazuhisa Sato/Prof.Satoshi Hata
Standard design
Thin Slit design for FIB
Set the sample on the cartridge in various ways.
The cartridge design can be changed depending on the sample set method.
Then, the cartridge on which the sample is placed set on the tem holder, and the cartridge is tensile by deforming.
TEM holder Specification
Material Model | |
---|---|
Tensile resolution | 1nm/step 3nm/dec |
Tensile Distance | 200μm |
tilt Angle | TFS ±65° JEOL HR PP ±60°/ UHR PP ±10° |
Cartridge Model | Prepare FIB and Bulk sample |
Soft Material Model | |
---|---|
Tensile resolution | 1nm/step 3nm/dec |
Tensile Distance | JEOL Model 800% TFS 200% |
tilt Angle | JEOL HR PP ±20°/ UHR PP ±10° TFS ±20° |
Cyclic Straining Mode | JEOL Available TFS Not Function |
Cartridge Model | Prepare Microtome and FIB |