3 Axis Tomofraphey Analitical Holder
3-axis orientation alignment Tomography
High efficiency EDS Analysis
Easy to link with other tools by using cartridges
Accurate 3D visualization (By courtesy of:Prof. Hata, Prof. Mitsuhara )
HPT-Cu
Austenitic steel
AL-Mg-Si
- Multi Function Structure -
- High detection efficiency structure for EDS analysis -
Free form X-ray shadowing
EDS detection efficiency is improved by the geometry of TEM Holder
High Resolution EDS analytical performance test:Column mapping of SrTiO3
- Double tilt Cartridge Linkage System -
The concept of our TEM holder is to make it into a cartridge.
- Comparison Tomography between TEM and Atom probe Tomography -
- Needle Probe Cartridge-
By creating a cartridge of our TEM Holder compatible with the Needle probe,
we have made it possible to perform tomography even with narrow gaps such as UHR.
TEM Holder Specification
High-Angle Triple-Axis tem holder
Applicable instrument:
TFS and JEOL TEM
Max X (α) tilt range +/-80° ( Limited by the Gonio stage tilt angle. )
Max Y (β) tilt range +/- 7.50° Supports high-resolution
Double tilt + cartridge structure
Sample rotation Stage (IDS)
Maximum Rotation range +/-5.00°
( Controlled by Mel-Build IDS )
Note: Not in-situ rotation
Minimum step control of angle:0.01°
Illumination for specimen